Scanning Electron Microscope

Easy Operation Super High Performance FE-SEM:  

• 0.6 nm @ 15kV,
• 0.7 nm @ 1kV

•  Auto-functions,
• Auto-alignment,
• Every image is a recipe

• LED (Lower Electron Detector) - A secondary electron detector system consisting of an in the chamber E-T type detector shall be standard. The user shall have control of the collector cage voltage in a minimum of 5 steps for both SE and BSE imaging.
• UED (Upper Electron Detector) - A through the lens detector with a user controllable energy filter for collection of topographic (SE) contrast or atomic number (BSE) contrast shall be standard.
• STEM (Scanning Transmission Detection) – The microscope should be capable of producing STEM images utilizing a STEM converter holder which should be included as standard with the system. The STEM imaging resolution should be 0.8 nm.
• SRBED (Short Working Distance Retractable Solid State BSE Detector) - The  backscattered electron detector must be a pneumatically retractable (from the GUI) solid state design that does not block SE signal or limit the collection of X-Rays and allows a working distance as short 2.0 mm when inserted. This detector shall produce pure compositional images with a resolution of 0.1Z at Z=29 and be operational at or below 1kV. 

• INCA energy system provides you the capability of semi-quantitative elemental analysis of samples.
• Cryo-system provides you the capability of imaging hydrated samples.

• Single digit Angstrom resolution at low voltage allowing samples to be viewed in their native state,
• Detectors with energy filters,
• Beam deceleration (at any kV, up to 5kV stage bias),
• STEM-in-SEM standard